$Ray Based Model for the Ultrasonic Time-of-Flight Diffraction Simulation of Thin Walled Structure Inspection$

Ray Based Model for the Ultrasonic Time-of-Flight Diffraction Simulation of Thin Walled Structure Inspection

It is necessary to size the cracklike defects accurately in order to extend the life of thin-walled (

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Bibliographische Detailangaben
Veröffentlicht in:	Journal of pressure vessel technology 2005-08, Vol.127 (3), p.262-268
Hauptverfasser:	Baskaran, G, Balasubramaniam, K, Krishnamurthy, C. V, Rao, C. Lakshmana
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	It is necessary to size the cracklike defects accurately in order to extend the life of thin-walled (
ISSN:	0094-9930 1528-8978
DOI:	10.1115/1.1989353