Physical modeling of high-current transients for bipolar transistor circuit simulation

Existing bipolar transistor models for circuit simulation are extended to properly account for the possible existence of a high-current-induced space-charge region in the epitaxial collector region. The new physical model thus correctly simulates ohmic and nonohmic quasi-saturation (base push-out),...

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Veröffentlicht in:IEEE transactions on electron devices 1987-04, Vol.34 (4), p.898-905
Hauptverfasser: Hanggeun Jeong, Fossum, J.G.
Format: Artikel
Sprache:eng
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Zusammenfassung:Existing bipolar transistor models for circuit simulation are extended to properly account for the possible existence of a high-current-induced space-charge region in the epitaxial collector region. The new physical model thus correctly simulates ohmic and nonohmic quasi-saturation (base push-out), for both steady-state and transient operation. High-current transients are accounted for quasi-statically, using a charge-based formalism. The model is implemented in SPICE, and representative simulations and measurements are presented to demonstrate both model utility and necessity.
ISSN:0018-9383
1557-9646
DOI:10.1109/T-ED.1987.23013