A high-speed 16-kbit n-MOS random-access memory

This paper presents one version of a high-speed 16-kbit dynamic MOS random-access memory (RAM). This memory utilizes a one transistor cell with an area of 22/spl times/36 /spl mu/m/SUP 2/ which is fabricated using advanced n-channel silicon-gate MOS technology (5-/spl mu/m photolithography). The mai...

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Veröffentlicht in:IEEE journal of solid-state circuits 1976-10, Vol.11 (5), p.585-590
Hauptverfasser: Itoh, K., Shimohigashi, K., Chiba, K., Taniguchi, K., Kawamoto, H.
Format: Artikel
Sprache:eng
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Zusammenfassung:This paper presents one version of a high-speed 16-kbit dynamic MOS random-access memory (RAM). This memory utilizes a one transistor cell with an area of 22/spl times/36 /spl mu/m/SUP 2/ which is fabricated using advanced n-channel silicon-gate MOS technology (5-/spl mu/m photolithography). The main feature of the design is a sense circuitry scheme, which allows a high speed (read access time of 200 ns) with low-power dissipation (600 mW at the 400-ns cycle time). The fully decoded memory is fabricated on a 5/spl times/7 mm/SUP 2/ chip and is assembled in a 22-lead ceramic dual-in-line package.
ISSN:0018-9200
1558-173X
DOI:10.1109/JSSC.1976.1050785