A digital readout technique for capacitive sensor applications

The difference between two capacitors is measured digitally using a charge redistribution technique incorporating a comparator, MOS switches, a successive approximation register, and a digital-to-analog converter. The technique is insensitive to comparator offset and parasitic capacitance, and the e...

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Veröffentlicht in:IEEE journal of solid-state circuits 1988-08, Vol.23 (4), p.972-977
Hauptverfasser: Kung, J.T., Lee, H.-S., Howe, R.T.
Format: Artikel
Sprache:eng
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Zusammenfassung:The difference between two capacitors is measured digitally using a charge redistribution technique incorporating a comparator, MOS switches, a successive approximation register, and a digital-to-analog converter. The technique is insensitive to comparator offset and parasitic capacitance, and the effect of MOS switch charge injection is measured and canceled. Extensive measurements have been made from test chips fabricated in 3- mu m CMOS technology. Detection of percent differences of
ISSN:0018-9200
1558-173X
DOI:10.1109/4.348