A digital readout technique for capacitive sensor applications
The difference between two capacitors is measured digitally using a charge redistribution technique incorporating a comparator, MOS switches, a successive approximation register, and a digital-to-analog converter. The technique is insensitive to comparator offset and parasitic capacitance, and the e...
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Veröffentlicht in: | IEEE journal of solid-state circuits 1988-08, Vol.23 (4), p.972-977 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The difference between two capacitors is measured digitally using a charge redistribution technique incorporating a comparator, MOS switches, a successive approximation register, and a digital-to-analog converter. The technique is insensitive to comparator offset and parasitic capacitance, and the effect of MOS switch charge injection is measured and canceled. Extensive measurements have been made from test chips fabricated in 3- mu m CMOS technology. Detection of percent differences of |
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ISSN: | 0018-9200 1558-173X |
DOI: | 10.1109/4.348 |