Modal characterization using Bragg gratings in photosensitive SiO (2)-Si strip waveguides

Modal characterization using Bragg gratings in photosensitive SiO (2)-Si strip waveguides

New methods for modal characterization of silica waveguides using UV-induced Bragg gratings are proposed. These methods rely either on the filtering of the fundamental optical mode with a Bragg filter or on the mode coupling by tilting the Bragg grating relative to the optical axis. Both theoretical...

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Veröffentlicht in:IEEE photonics technology letters 1997-06, Vol.9 (6), p.788-790
Hauptverfasser: Le Gall, F, Loaec, F, Devoldere, N, Loisel, B, Mehadji, K, Moisan, M
Format: Artikel
Sprache:eng
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Zusammenfassung:New methods for modal characterization of silica waveguides using UV-induced Bragg gratings are proposed. These methods rely either on the filtering of the fundamental optical mode with a Bragg filter or on the mode coupling by tilting the Bragg grating relative to the optical axis. Both theoretical and experimental results are reported
ISSN:1041-1135
DOI:10.1109/68.584991