Magnetoelastic effects in sputtered Ni/Ti multilayers
Magnetoelastic tensor components M/sub 11/ and M/sub 12/ for Ni/Ti multilayers are measured at room temperature using strain modulated ferromagnetic resonance (SMFMR). The dependence of M/sub 11/ and M/sub 12/ on the inverse Ni layer thickness is interpreted as mainly due to anisotropic volume and i...
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| Veröffentlicht in: | IEEE transactions on magnetics 1993-11, Vol.29 (6), p.3114-3116 |
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| container_end_page | 3116 |
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| container_issue | 6 |
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| container_title | IEEE transactions on magnetics |
| container_volume | 29 |
| creator | Szymczak, H. Zuberek, R. Krishnan, R. Sella, C. Kaabouchi, M. |
| description | Magnetoelastic tensor components M/sub 11/ and M/sub 12/ for Ni/Ti multilayers are measured at room temperature using strain modulated ferromagnetic resonance (SMFMR). The dependence of M/sub 11/ and M/sub 12/ on the inverse Ni layer thickness is interpreted as mainly due to anisotropic volume and isotropic interface interactions. It is suggested that the SMFMR method provides the possibility of distinguishing between intrinsic surface magnetostriction and interdiffusion effects.< > |
| doi_str_mv | 10.1109/20.280882 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_28797766</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>280882</ieee_id><sourcerecordid>28797766</sourcerecordid><originalsourceid>FETCH-LOGICAL-c337t-4de102072e348a81f9c1844ccc3f11325f88b3f1ba9add8167f98310a11fd9d73</originalsourceid><addsrcrecordid>eNqNkD1PwzAQhi0EEqUwsDJlQEgMae9sJ7FHhPiSCixljlznjIzStNjO0H9PqlSdme5O73PP8DJ2jTBDBD3nMOMKlOInbIJaYg5Q6lM2AUCVa1nKc3YR489wygJhwop3891R2lBrYvI2I-fIppj5LovbPiUK1GQffr702bpvk2_NjkK8ZGfOtJGuDnPKvp6flo-v-eLz5e3xYZFbIaqUy4YQOFSchFRGodMWlZTWWuEQBS-cUqthXRltmkZhWTmtBIJBdI1uKjFld6N3Gza_PcVUr3201Lamo00fa64qXVVl-Q9QaC34HrwfQRs2MQZy9Tb4tQm7GqHeN1hzqMcGB_b2IDXRmtYF01kfjw-SixJ0MWA3I-aJ6JgeHH-S83an</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>28399326</pqid></control><display><type>article</type><title>Magnetoelastic effects in sputtered Ni/Ti multilayers</title><source>IEEE Electronic Library (IEL)</source><creator>Szymczak, H. ; Zuberek, R. ; Krishnan, R. ; Sella, C. ; Kaabouchi, M.</creator><creatorcontrib>Szymczak, H. ; Zuberek, R. ; Krishnan, R. ; Sella, C. ; Kaabouchi, M.</creatorcontrib><description>Magnetoelastic tensor components M/sub 11/ and M/sub 12/ for Ni/Ti multilayers are measured at room temperature using strain modulated ferromagnetic resonance (SMFMR). The dependence of M/sub 11/ and M/sub 12/ on the inverse Ni layer thickness is interpreted as mainly due to anisotropic volume and isotropic interface interactions. It is suggested that the SMFMR method provides the possibility of distinguishing between intrinsic surface magnetostriction and interdiffusion effects.< ></description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/20.280882</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Exact sciences and technology ; Magnetic anisotropy ; Magnetic field induced strain ; Magnetic modulators ; Magnetic multilayers ; Magnetic properties and materials ; Magnetic properties of monolayers and thin films ; Magnetic properties of surface, thin films and multilayers ; Magnetic resonance ; Magnetostriction ; Metals. Metallurgy ; Perpendicular magnetic anisotropy ; Physics ; Strain measurement ; Temperature measurement ; Tensile stress</subject><ispartof>IEEE transactions on magnetics, 1993-11, Vol.29 (6), p.3114-3116</ispartof><rights>1994 INIST-CNRS</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c337t-4de102072e348a81f9c1844ccc3f11325f88b3f1ba9add8167f98310a11fd9d73</citedby><cites>FETCH-LOGICAL-c337t-4de102072e348a81f9c1844ccc3f11325f88b3f1ba9add8167f98310a11fd9d73</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/280882$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,776,780,785,786,792,23909,23910,25118,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/280882$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=4236095$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Szymczak, H.</creatorcontrib><creatorcontrib>Zuberek, R.</creatorcontrib><creatorcontrib>Krishnan, R.</creatorcontrib><creatorcontrib>Sella, C.</creatorcontrib><creatorcontrib>Kaabouchi, M.</creatorcontrib><title>Magnetoelastic effects in sputtered Ni/Ti multilayers</title><title>IEEE transactions on magnetics</title><addtitle>TMAG</addtitle><description>Magnetoelastic tensor components M/sub 11/ and M/sub 12/ for Ni/Ti multilayers are measured at room temperature using strain modulated ferromagnetic resonance (SMFMR). The dependence of M/sub 11/ and M/sub 12/ on the inverse Ni layer thickness is interpreted as mainly due to anisotropic volume and isotropic interface interactions. It is suggested that the SMFMR method provides the possibility of distinguishing between intrinsic surface magnetostriction and interdiffusion effects.< ></description><subject>Applied sciences</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Exact sciences and technology</subject><subject>Magnetic anisotropy</subject><subject>Magnetic field induced strain</subject><subject>Magnetic modulators</subject><subject>Magnetic multilayers</subject><subject>Magnetic properties and materials</subject><subject>Magnetic properties of monolayers and thin films</subject><subject>Magnetic properties of surface, thin films and multilayers</subject><subject>Magnetic resonance</subject><subject>Magnetostriction</subject><subject>Metals. Metallurgy</subject><subject>Perpendicular magnetic anisotropy</subject><subject>Physics</subject><subject>Strain measurement</subject><subject>Temperature measurement</subject><subject>Tensile stress</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1993</creationdate><recordtype>article</recordtype><recordid>eNqNkD1PwzAQhi0EEqUwsDJlQEgMae9sJ7FHhPiSCixljlznjIzStNjO0H9PqlSdme5O73PP8DJ2jTBDBD3nMOMKlOInbIJaYg5Q6lM2AUCVa1nKc3YR489wygJhwop3891R2lBrYvI2I-fIppj5LovbPiUK1GQffr702bpvk2_NjkK8ZGfOtJGuDnPKvp6flo-v-eLz5e3xYZFbIaqUy4YQOFSchFRGodMWlZTWWuEQBS-cUqthXRltmkZhWTmtBIJBdI1uKjFld6N3Gza_PcVUr3201Lamo00fa64qXVVl-Q9QaC34HrwfQRs2MQZy9Tb4tQm7GqHeN1hzqMcGB_b2IDXRmtYF01kfjw-SixJ0MWA3I-aJ6JgeHH-S83an</recordid><startdate>19931101</startdate><enddate>19931101</enddate><creator>Szymczak, H.</creator><creator>Zuberek, R.</creator><creator>Krishnan, R.</creator><creator>Sella, C.</creator><creator>Kaabouchi, M.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>8BQ</scope><scope>JG9</scope></search><sort><creationdate>19931101</creationdate><title>Magnetoelastic effects in sputtered Ni/Ti multilayers</title><author>Szymczak, H. ; Zuberek, R. ; Krishnan, R. ; Sella, C. ; Kaabouchi, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c337t-4de102072e348a81f9c1844ccc3f11325f88b3f1ba9add8167f98310a11fd9d73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1993</creationdate><topic>Applied sciences</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Exact sciences and technology</topic><topic>Magnetic anisotropy</topic><topic>Magnetic field induced strain</topic><topic>Magnetic modulators</topic><topic>Magnetic multilayers</topic><topic>Magnetic properties and materials</topic><topic>Magnetic properties of monolayers and thin films</topic><topic>Magnetic properties of surface, thin films and multilayers</topic><topic>Magnetic resonance</topic><topic>Magnetostriction</topic><topic>Metals. Metallurgy</topic><topic>Perpendicular magnetic anisotropy</topic><topic>Physics</topic><topic>Strain measurement</topic><topic>Temperature measurement</topic><topic>Tensile stress</topic><toplevel>online_resources</toplevel><creatorcontrib>Szymczak, H.</creatorcontrib><creatorcontrib>Zuberek, R.</creatorcontrib><creatorcontrib>Krishnan, R.</creatorcontrib><creatorcontrib>Sella, C.</creatorcontrib><creatorcontrib>Kaabouchi, M.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>METADEX</collection><collection>Materials Research Database</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Szymczak, H.</au><au>Zuberek, R.</au><au>Krishnan, R.</au><au>Sella, C.</au><au>Kaabouchi, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Magnetoelastic effects in sputtered Ni/Ti multilayers</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>1993-11-01</date><risdate>1993</risdate><volume>29</volume><issue>6</issue><spage>3114</spage><epage>3116</epage><pages>3114-3116</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>Magnetoelastic tensor components M/sub 11/ and M/sub 12/ for Ni/Ti multilayers are measured at room temperature using strain modulated ferromagnetic resonance (SMFMR). The dependence of M/sub 11/ and M/sub 12/ on the inverse Ni layer thickness is interpreted as mainly due to anisotropic volume and isotropic interface interactions. It is suggested that the SMFMR method provides the possibility of distinguishing between intrinsic surface magnetostriction and interdiffusion effects.< ></abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/20.280882</doi><tpages>3</tpages></addata></record> |
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| ispartof | IEEE transactions on magnetics, 1993-11, Vol.29 (6), p.3114-3116 |
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| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Magnetic anisotropy Magnetic field induced strain Magnetic modulators Magnetic multilayers Magnetic properties and materials Magnetic properties of monolayers and thin films Magnetic properties of surface, thin films and multilayers Magnetic resonance Magnetostriction Metals. Metallurgy Perpendicular magnetic anisotropy Physics Strain measurement Temperature measurement Tensile stress |
| title | Magnetoelastic effects in sputtered Ni/Ti multilayers |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-01T22%3A53%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Magnetoelastic%20effects%20in%20sputtered%20Ni/Ti%20multilayers&rft.jtitle=IEEE%20transactions%20on%20magnetics&rft.au=Szymczak,%20H.&rft.date=1993-11-01&rft.volume=29&rft.issue=6&rft.spage=3114&rft.epage=3116&rft.pages=3114-3116&rft.issn=0018-9464&rft.eissn=1941-0069&rft.coden=IEMGAQ&rft_id=info:doi/10.1109/20.280882&rft_dat=%3Cproquest_RIE%3E28797766%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=28399326&rft_id=info:pmid/&rft_ieee_id=280882&rfr_iscdi=true |