Magnetoelastic effects in sputtered Ni/Ti multilayers

Magnetoelastic effects in sputtered Ni/Ti multilayers

Magnetoelastic tensor components M/sub 11/ and M/sub 12/ for Ni/Ti multilayers are measured at room temperature using strain modulated ferromagnetic resonance (SMFMR). The dependence of M/sub 11/ and M/sub 12/ on the inverse Ni layer thickness is interpreted as mainly due to anisotropic volume and i...

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Veröffentlicht in:IEEE transactions on magnetics 1993-11, Vol.29 (6), p.3114-3116
Hauptverfasser: Szymczak, H., Zuberek, R., Krishnan, R., Sella, C., Kaabouchi, M.
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Magnetic anisotropy
Magnetic field induced strain
Magnetic modulators
Magnetic multilayers
Magnetic properties and materials
Magnetic properties of monolayers and thin films
Magnetic properties of surface, thin films and multilayers
Magnetic resonance
Magnetostriction
Metals. Metallurgy
Perpendicular magnetic anisotropy
Physics
Strain measurement
Temperature measurement
Tensile stress
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Zusammenfassung:Magnetoelastic tensor components M/sub 11/ and M/sub 12/ for Ni/Ti multilayers are measured at room temperature using strain modulated ferromagnetic resonance (SMFMR). The dependence of M/sub 11/ and M/sub 12/ on the inverse Ni layer thickness is interpreted as mainly due to anisotropic volume and isotropic interface interactions. It is suggested that the SMFMR method provides the possibility of distinguishing between intrinsic surface magnetostriction and interdiffusion effects.< >
ISSN:0018-9464
1941-0069
DOI:10.1109/20.280882