Systematic study on photoresist removal using hydrogen atoms generated on heated catalyzer

Photoresist removal is one of the most important techniques in the fabrication of semiconductor devices. Here, H atoms generated on heated W catalyzer from H 2 gas molecules were used for photoresist removal instead of O 2-plasma ashing. Resist removal conditions such as catalyzer temperature, catal...

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Veröffentlicht in:Thin solid films 2006-04, Vol.501 (1), p.326-328
Hauptverfasser: Hashimoto, Kouhei, Masuda, Atsushi, Matsumura, Hideki, Ishibashi, Tomoatsu, Takao, Kazuhisa
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Sprache:eng
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