Systematic study on photoresist removal using hydrogen atoms generated on heated catalyzer
Photoresist removal is one of the most important techniques in the fabrication of semiconductor devices. Here, H atoms generated on heated W catalyzer from H 2 gas molecules were used for photoresist removal instead of O 2-plasma ashing. Resist removal conditions such as catalyzer temperature, catal...
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Veröffentlicht in: | Thin solid films 2006-04, Vol.501 (1), p.326-328 |
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Format: | Artikel |
Sprache: | eng |
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