Exact maximum likelihood estimation using masked system data

Exact maximum likelihood estimation using masked system data

This work estimates component reliability from masked series-system life data, viz, data where the exact component causing system failure might be unknown. The authors extend the results of Usher and Hodgson (1988) by deriving exact maximum likelihood estimators (MLE) for the general case of a serie...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on reliability 1993-12, Vol.42 (4), p.631-635
Hauptverfasser: Lin, D.K.J., Usher, J.S., Guess, F.M.
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Assembly systems
Associate members
Circuits
Closed-form solution
Exact sciences and technology
Failure analysis
Iterative methods
Life estimation
Maximum likelihood estimation
Nonlinear equations
Operational research and scientific management
Operational research. Management science
Reliability theory. Replacement problems
Risk analysis
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:This work estimates component reliability from masked series-system life data, viz, data where the exact component causing system failure might be unknown. The authors extend the results of Usher and Hodgson (1988) by deriving exact maximum likelihood estimators (MLE) for the general case of a series system of three exponential components with independent masking. Their previous work shows that closed-form MLE are intractable, and they propose an iterative method for the solution of a system of three nonlinear likelihood equations.< >
ISSN:0018-9529
1558-1721
DOI:10.1109/24.273596