Test results for transient excitation boosting at Grand Coulee
Transient excitation boosting (TEB) hardware is discussed, and its design and installation are described. The test results from the hardware commissioning on each generator type are addressed. The results show that an 8% boost in terminal voltage results in about a 50% change in reactive power loadi...
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Veröffentlicht in: | IEEE transactions on energy conversion 1991-09, Vol.6 (3), p.367-372 |
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creator | Lennon, C.A. |
description | Transient excitation boosting (TEB) hardware is discussed, and its design and installation are described. The test results from the hardware commissioning on each generator type are addressed. The results show that an 8% boost in terminal voltage results in about a 50% change in reactive power loading and about a 10% change in real power with the classical high-frequency damped oscillations which are typical of a step response.< > |
doi_str_mv | 10.1109/60.84308 |
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The test results from the hardware commissioning on each generator type are addressed. The results show that an 8% boost in terminal voltage results in about a 50% change in reactive power loading and about a 10% change in real power with the classical high-frequency damped oscillations which are typical of a step response.< ></description><identifier>ISSN: 0885-8969</identifier><identifier>EISSN: 1558-0059</identifier><identifier>DOI: 10.1109/60.84308</identifier><identifier>CODEN: ITCNE4</identifier><language>eng</language><publisher>IEEE</publisher><subject>Boosting ; Hardware ; Microcomputers ; Microwave devices ; Power generation ; Power system relaying ; Regulators ; Signal generators ; Testing ; Voltage</subject><ispartof>IEEE transactions on energy conversion, 1991-09, Vol.6 (3), p.367-372</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c308t-3315794003b03ebbc02f812dd4d0faa0eea500223681d9e797c538e7cef74a3d3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/84308$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/84308$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Lennon, C.A.</creatorcontrib><title>Test results for transient excitation boosting at Grand Coulee</title><title>IEEE transactions on energy conversion</title><addtitle>TEC</addtitle><description>Transient excitation boosting (TEB) hardware is discussed, and its design and installation are described. The test results from the hardware commissioning on each generator type are addressed. The results show that an 8% boost in terminal voltage results in about a 50% change in reactive power loading and about a 10% change in real power with the classical high-frequency damped oscillations which are typical of a step response.< ></description><subject>Boosting</subject><subject>Hardware</subject><subject>Microcomputers</subject><subject>Microwave devices</subject><subject>Power generation</subject><subject>Power system relaying</subject><subject>Regulators</subject><subject>Signal generators</subject><subject>Testing</subject><subject>Voltage</subject><issn>0885-8969</issn><issn>1558-0059</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1991</creationdate><recordtype>article</recordtype><recordid>eNo90EFLxDAQBeAgCq6r4NVbTuKl6yRp2uQiyKKrsOBlPYc0nUqk26xJCvrvrVY8zWE-Ho9HyCWDFWOgbytYqVKAOiILJqUqAKQ-JgtQShZKV_qUnKX0DsBKydmC3O0wZRoxjX1OtAuR5miH5HHIFD-dzzb7MNAmhJT98EZtppsJtHQdxh7xnJx0tk948XeX5PXxYbd-KrYvm-f1_bZwU5VcCMFkrUsA0YDApnHAO8V425YtdNYCopUAnItKsVZjrWsnhcLaYVeXVrRiSa7n3EMMH-NU2ex9ctj3dsAwJsNVpaXm1QRvZuhiSCliZw7R7238MgzMz0CmAvM70ESvZuoR8Z_Nv28kl1-x</recordid><startdate>19910901</startdate><enddate>19910901</enddate><creator>Lennon, C.A.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>L7M</scope></search><sort><creationdate>19910901</creationdate><title>Test results for transient excitation boosting at Grand Coulee</title><author>Lennon, C.A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c308t-3315794003b03ebbc02f812dd4d0faa0eea500223681d9e797c538e7cef74a3d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1991</creationdate><topic>Boosting</topic><topic>Hardware</topic><topic>Microcomputers</topic><topic>Microwave devices</topic><topic>Power generation</topic><topic>Power system relaying</topic><topic>Regulators</topic><topic>Signal generators</topic><topic>Testing</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lennon, C.A.</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on energy conversion</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lennon, C.A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Test results for transient excitation boosting at Grand Coulee</atitle><jtitle>IEEE transactions on energy conversion</jtitle><stitle>TEC</stitle><date>1991-09-01</date><risdate>1991</risdate><volume>6</volume><issue>3</issue><spage>367</spage><epage>372</epage><pages>367-372</pages><issn>0885-8969</issn><eissn>1558-0059</eissn><coden>ITCNE4</coden><abstract>Transient excitation boosting (TEB) hardware is discussed, and its design and installation are described. The test results from the hardware commissioning on each generator type are addressed. The results show that an 8% boost in terminal voltage results in about a 50% change in reactive power loading and about a 10% change in real power with the classical high-frequency damped oscillations which are typical of a step response.< ></abstract><pub>IEEE</pub><doi>10.1109/60.84308</doi><tpages>6</tpages><oa>free_for_read</oa></addata></record> |
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ispartof | IEEE transactions on energy conversion, 1991-09, Vol.6 (3), p.367-372 |
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language | eng |
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source | IEEE Electronic Library (IEL) |
subjects | Boosting Hardware Microcomputers Microwave devices Power generation Power system relaying Regulators Signal generators Testing Voltage |
title | Test results for transient excitation boosting at Grand Coulee |
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