Total-dose hardening of a bipolar-voltage comparator

Total-dose hardening of a bipolar-voltage comparator

A radiation-tolerant bipolar-voltage comparator experienced severe degradation of radiation hardness when layout of the part was redrawn and the process moved from a 4-in wafer to a 6-in wafer line. The reasons for the loss in hardness are identified, and it is shown that modifications to the design...

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Veröffentlicht in:IEEE transactions on nuclear science 2002-12, Vol.49 (6), p.3180-3184
Hauptverfasser: Pease, R.L., Maher, M.C., Shaneyfelt, M.R., Savage, M.W., Baker, P., Krieg, J., Turflinger, T.L.
Format: Artikel
Sprache:eng
Schlagworte:
Aerospace testing
Analog circuits
Comparators
Cranes
Degradation
Hardening
Hardness
Ionization
Laboratories
Military standards
Positron emission tomography
Radiation hardness
Tellurium
Voltage
Wafers
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Beschreibung
Zusammenfassung:A radiation-tolerant bipolar-voltage comparator experienced severe degradation of radiation hardness when layout of the part was redrawn and the process moved from a 4-in wafer to a 6-in wafer line. The reasons for the loss in hardness are identified, and it is shown that modifications to the design layout eliminate the problem.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2002.805404