Widely extended new method for measuring the impedance ( < e1 > C < /e1 > (x) < e1 > R < /e1 > (x)) at high frequencies with applications

A method is described for the accurate measurement of the equivalent parallel capacitance < e1 > C < /e1 > (x) and resistance < e1 > R < /e1 > (x) of very high loss materials at high frequencies. The important characteristic of the method is its capability of measuring the va...

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Veröffentlicht in:	IEEE transactions on instrumentation and measurement 1989-02, Vol.38 (1), p.64-73
Hauptverfasser:	Ichijo, B, Masuda, Y, Tarao, N, Sada, M
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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