Computing aberration coefficients for plane-symmetric reflective systems: a Lie algebraic approach

We apply the Lie algebraic method to reflecting optical systems with plane-symmetric freeform mirrors. Using analytical ray-tracing equations, we construct an optical map. The expansion of this map gives us the aberration coefficients in terms of initial ray coordinates. The Lie algebraic method is...

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Veröffentlicht in:Journal of the Optical Society of America. A, Optics, image science, and vision Optics, image science, and vision, 2023-06, Vol.40 (6), p.1215-1224
Hauptverfasser: Barion, A., Anthonissen, M. J. H., ten Thije Boonkkamp, J. H. M., IJzerman, W. L.
Format: Artikel
Sprache:eng
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Zusammenfassung:We apply the Lie algebraic method to reflecting optical systems with plane-symmetric freeform mirrors. Using analytical ray-tracing equations, we construct an optical map. The expansion of this map gives us the aberration coefficients in terms of initial ray coordinates. The Lie algebraic method is applied to treat aberrations up to arbitrary order. The presented method provides a systematic and rigorous approach to the derivation, treatment, and composition of aberrations in plane-symmetric systems. We give the results for second- and third-order aberrations and apply them to three single-mirror examples.
ISSN:1084-7529
1520-8532
DOI:10.1364/JOSAA.487343