Study of the influence of clock instabilities in synchronized data acquisition systems
The influence of clock jitter (for example, phase noise) in synchronized measurement systems (signal generator + data acquisition) on the quality of the measurements is studied. Explicit expressions for the measurement errors are derived for sinusoidal phase noise. These expressions can be used to s...
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Veröffentlicht in: | IEEE transactions on instrumentation and measurement 1996-04, Vol.45 (2), p.601-604 |
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creator | Schoukens, J. Louage, F. Rolain, Y. |
description | The influence of clock jitter (for example, phase noise) in synchronized measurement systems (signal generator + data acquisition) on the quality of the measurements is studied. Explicit expressions for the measurement errors are derived for sinusoidal phase noise. These expressions can be used to specify the required clock stability of data acquisition systems. |
doi_str_mv | 10.1109/19.492795 |
format | Article |
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Explicit expressions for the measurement errors are derived for sinusoidal phase noise. 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Explicit expressions for the measurement errors are derived for sinusoidal phase noise. These expressions can be used to specify the required clock stability of data acquisition systems.</description><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>Circuits of signal characteristics conditioning (including delay circuits)</subject><subject>Clocks</subject><subject>Data acquisition</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Jitter</subject><subject>Measurement errors</subject><subject>Noise measurement</subject><subject>Phase measurement</subject><subject>Phase noise</subject><subject>Signal generators</subject><subject>Stability</subject><subject>Synchronization</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1996</creationdate><recordtype>article</recordtype><recordid>eNqFkDlPw0AQhVcIJEKgoKVygZAoDHt4rxJFXFIkCo7WWq9nlQXHTjx2EX49thylpRrNvG_ejB4hl4zeMUbtPbN3meXayiMyY1Lq1CrFj8mMUmZSm0l1Ss4QvymlWmV6Rr7eu77cJU1IuhUksQ5VD7WHceCrxv8MI-xcEavYRcChS3BX-1Xb1PEXyqR0nUuc3_YRB6AZVexgjefkJLgK4WJf5-Tz6fFj8ZIu355fFw_L1Auhu9SC0YZJLUshS22CBgZFQWUAIyy1wgYaAufCMSW4L5jzggNAIXmhAIwSc3Iz-W7aZtsDdvk6ooeqcjU0PebcKJYZQ_8HlVDCcjuAtxPo2waxhZBv2rh27S5nNB8jzpnNp4gH9npv6tC7KrSu9hEPC4IxxeR4-2rC4vD7Qd17_AHGi4QN</recordid><startdate>19960401</startdate><enddate>19960401</enddate><creator>Schoukens, J.</creator><creator>Louage, F.</creator><creator>Rolain, Y.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>7U5</scope></search><sort><creationdate>19960401</creationdate><title>Study of the influence of clock instabilities in synchronized data acquisition systems</title><author>Schoukens, J. ; Louage, F. ; Rolain, Y.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c337t-9e8781575d35d78f7e1ebb05fe8390939f0ff223a1632cb1ac32eeeb52b6ee863</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>Circuits of signal characteristics conditioning (including delay circuits)</topic><topic>Clocks</topic><topic>Data acquisition</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Jitter</topic><topic>Measurement errors</topic><topic>Noise measurement</topic><topic>Phase measurement</topic><topic>Phase noise</topic><topic>Signal generators</topic><topic>Stability</topic><topic>Synchronization</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Schoukens, J.</creatorcontrib><creatorcontrib>Louage, F.</creatorcontrib><creatorcontrib>Rolain, Y.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Solid State and Superconductivity Abstracts</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Schoukens, J.</au><au>Louage, F.</au><au>Rolain, Y.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Study of the influence of clock instabilities in synchronized data acquisition systems</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>1996-04-01</date><risdate>1996</risdate><volume>45</volume><issue>2</issue><spage>601</spage><epage>604</epage><pages>601-604</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>The influence of clock jitter (for example, phase noise) in synchronized measurement systems (signal generator + data acquisition) on the quality of the measurements is studied. Explicit expressions for the measurement errors are derived for sinusoidal phase noise. These expressions can be used to specify the required clock stability of data acquisition systems.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/19.492795</doi><tpages>4</tpages></addata></record> |
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ispartof | IEEE transactions on instrumentation and measurement, 1996-04, Vol.45 (2), p.601-604 |
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language | eng |
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source | IEEE Electronic Library (IEL) |
subjects | Applied sciences Circuit properties Circuits of signal characteristics conditioning (including delay circuits) Clocks Data acquisition Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Jitter Measurement errors Noise measurement Phase measurement Phase noise Signal generators Stability Synchronization |
title | Study of the influence of clock instabilities in synchronized data acquisition systems |
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