Study of the influence of clock instabilities in synchronized data acquisition systems

The influence of clock jitter (for example, phase noise) in synchronized measurement systems (signal generator + data acquisition) on the quality of the measurements is studied. Explicit expressions for the measurement errors are derived for sinusoidal phase noise. These expressions can be used to s...

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Veröffentlicht in:	IEEE transactions on instrumentation and measurement 1996-04, Vol.45 (2), p.601-604
Hauptverfasser:	Schoukens, J., Louage, F., Rolain, Y.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Circuit properties Circuits of signal characteristics conditioning (including delay circuits) Clocks Data acquisition Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Jitter Measurement errors Noise measurement Phase measurement Phase noise Signal generators Stability Synchronization
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Beschreibung
Zusammenfassung:	The influence of clock jitter (for example, phase noise) in synchronized measurement systems (signal generator + data acquisition) on the quality of the measurements is studied. Explicit expressions for the measurement errors are derived for sinusoidal phase noise. These expressions can be used to specify the required clock stability of data acquisition systems.
ISSN:	0018-9456 1557-9662
DOI:	10.1109/19.492795