Influence of the deformation on the luminescence properties of Si light-emitting diodes

Electroluminescence (EL) in a wavelength range of 1.0–1.65 µm at currents up to 1500 mA has been studied in light‐emitting diodes (LEDs) deformed by four‐point bending at 650 °C. LEDs were fabricated by the implantation of B and P ions into n‐Cz‐Si and n‐FZ‐Si substrates with subsequent anneals in a...

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Veröffentlicht in:Physica status solidi. C 2005-04, Vol.2 (6), p.1842-1846
Hauptverfasser: Sobolev, N.A., Emel'yanov, A.M., Shek, E.I., Feklisova, O.V., Yakimov, E.B., Kotereva, T.V.
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Sprache:eng
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