Influence of the deformation on the luminescence properties of Si light-emitting diodes
Electroluminescence (EL) in a wavelength range of 1.0–1.65 µm at currents up to 1500 mA has been studied in light‐emitting diodes (LEDs) deformed by four‐point bending at 650 °C. LEDs were fabricated by the implantation of B and P ions into n‐Cz‐Si and n‐FZ‐Si substrates with subsequent anneals in a...
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Veröffentlicht in: | Physica status solidi. C 2005-04, Vol.2 (6), p.1842-1846 |
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Format: | Artikel |
Sprache: | eng |
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