Rectifying semiconductor-ferroelectric polarization loops and offsets in Pt-BaTiO3-ZnO-Pt thin film capacitor structures

Electrical and polarization hysteresis measurements on Pt-BaTiO3-ZnO-Pt heterostructures, grown by pulsed laser deposition on (001)Si, are reported. The layers were deposited without breaking the vacuum using a switchable target holder. Offsets of hysteresis loops along the polarization axis with in...

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Veröffentlicht in:Thin solid films 2005-08, Vol.486 (1-2), p.153-157
Hauptverfasser: ASHKENOV, N, SCHUBERT, M, TWERDOWSKI, E, WENCKSTEM, H. V, MBENKUM, B. N, HOCHMUTH, H, LORENZ, M, GRILL, W, GMNDMANN, M
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Sprache:eng
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Zusammenfassung:Electrical and polarization hysteresis measurements on Pt-BaTiO3-ZnO-Pt heterostructures, grown by pulsed laser deposition on (001)Si, are reported. The layers were deposited without breaking the vacuum using a switchable target holder. Offsets of hysteresis loops along the polarization axis with increasing sweeping voltage, time-dependent charging, and rectifying behavior are observed. A simple electrical circuitry can be used to model the observed hysteresis behavior, where the interface between the wurtzite-structure ZnO and the pervoskite-structure BaTiO3 is seen as the origin of a space charge accumulation region. Coupling between spontaneous wurtzite and switchable ferroelectric polarization is discussed.
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2004.11.226