Optimal interconnect diagnosis of wiring networks

Optimal interconnect diagnosis of wiring networks

Interconnect diagnosis is an important problem in very large scale integration (VLSI), multichip module (MCM) and printed circuit board (PCB) production. The problem is to detect and locate all the shorts, opens and stuck-at faults among a set of nets using the minimum number of parallel tests. In t...

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Veröffentlicht in:IEEE transactions on very large scale integration (VLSI) systems 1995-09, Vol.3 (3), p.430-436
Hauptverfasser: Weiping Shi, Fuchs, W.K.
Format: Artikel
Sprache:eng
Schlagworte:
Circuit faults
Circuit testing
Electrical fault detection
Fault detection
Integrated circuit interconnections
Multichip modules
Printed circuits
Production
Very large scale integration
Wiring
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Zusammenfassung:Interconnect diagnosis is an important problem in very large scale integration (VLSI), multichip module (MCM) and printed circuit board (PCB) production. The problem is to detect and locate all the shorts, opens and stuck-at faults among a set of nets using the minimum number of parallel tests. In this paper, we present worst-case optimal algorithms and lower bounds to several open problems in interconnect diagnosis.< >
ISSN:1063-8210
1557-9999
DOI:10.1109/92.407000