High ON/OFF ratio and stability of amorphous organic field-effect transistors based on spiro-linked compounds
We report high ON/OFF ratios for organic field-effect transistors (OFETs) based on amorphous thin films of spiro-linked compounds. Bottom-contact OFET structures are fabricated, using 2,2′,7,7′-tetra-( m-tolyl-phenylamino)-9,9′-spirobifluorene (Spiro-TPD) and 2,2′,7,7′-tetrakis-(diphenylamino)-9,9′-...
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Veröffentlicht in: | Synthetic metals 2005-02, Vol.148 (3), p.267-270 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We report high ON/OFF ratios for organic field-effect transistors (OFETs) based on amorphous thin films of spiro-linked compounds. Bottom-contact OFET structures are fabricated, using 2,2′,7,7′-tetra-(
m-tolyl-phenylamino)-9,9′-spirobifluorene (Spiro-TPD) and 2,2′,7,7′-tetrakis-(diphenylamino)-9,9′-spirobifluorene (Spiro-TAD) as active materials. The field-effect mobility of holes in Spiro-TPD and Spiro-TAD thin films is 7
×
10
−5
cm
2/Vs. We obtained ON/OFF ratios up to 3.6
×
10
6 with low OFF currents in the pA range. Time-dependent measurements show that the transistor characteristics do not change significantly over 9 months. |
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ISSN: | 0379-6779 1879-3290 |
DOI: | 10.1016/j.synthmet.2004.10.007 |