Optimizing the NIST magnetic imaging reference sample

Optimizing the NIST magnetic imaging reference sample

We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force microscope tip. Several samples cut from the same disk were measured with a single tip. We have also measured a single transition with sever...

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Veröffentlicht in:IEEE transactions on magnetics 1997-09, Vol.33 (5), p.4065-4067
Hauptverfasser: Rice, P., Russek, S.E., Hoinville, J., Kelley, M.H.
Format: Artikel
Sprache:eng
Schlagworte:
Instruments
Magnetic analysis
Magnetic force microscopy
Magnetic forces
Magnetic separation
Magnetization
NIST
Optical imaging
Perpendicular magnetic recording
Surface topography
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Zusammenfassung:We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force microscope tip. Several samples cut from the same disk were measured with a single tip. We have also measured a single transition with several tips. Both measurements have shown the variability in images taken with different tips and different instrument configuration which underscores the need for a well calibrated sample.
ISSN:0018-9464
1941-0069
DOI:10.1109/20.619664