Application of Deschamps' Graphical Method to Measurements of the Scattering Coefficients of Multiport Waveguide Junctions

Application of Deschamps' Graphical Method to Measurements of the Scattering Coefficients of Multiport Waveguide Junctions

A method for measuring scattering coefficients of a multiport waveguide junction is presented. It is based on the application of Deschamps' graphical technique to reduced multiport junctions, and analysis of measurements done with either matched or nearly matched loads terminated at all but the...

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Veröffentlicht in:IEEE transactions on microwave theory and techniques 1972-02, Vol.20 (2), p.186-187
1. Verfasser: Chang, C.T.M.
Format: Artikel
Sprache:eng
Schlagworte:
Atomic measurements
Diodes
Equations
Frequency
Oscillators
Reflection
Scattering
Silicon
UHF measurements
Waveguide junctions
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Zusammenfassung:A method for measuring scattering coefficients of a multiport waveguide junction is presented. It is based on the application of Deschamps' graphical technique to reduced multiport junctions, and analysis of measurements done with either matched or nearly matched loads terminated at all but the input and output ports. Averaging and least-square fitting are introduced to reduce errors from measurements.
ISSN:0018-9480
1557-9670
DOI:10.1109/TMTT.1972.1127709