Characterisation of GaN crystals and epilayers grown from a solution at room pressure

GaN crystals were synthesised in a horizontal reactor system using ammonia as a nitrogen source. In the first part of this project a parameter study was performed to evaluate a suitable growth window, concerning e.g. process temperature, gas flows or partial pressures of the process gases. These fir...

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Veröffentlicht in:Physica status solidi. C 2005-05, Vol.2 (7), p.2040-2043
Hauptverfasser: Meissner, E., Birkmann, B., Hussy, S., Sun, G., Friedrich, J., Mueller, G.
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Sprache:eng
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Zusammenfassung:GaN crystals were synthesised in a horizontal reactor system using ammonia as a nitrogen source. In the first part of this project a parameter study was performed to evaluate a suitable growth window, concerning e.g. process temperature, gas flows or partial pressures of the process gases. These first experiments were carried out in a horizontal reactor with a silica ampoule using a quartz crucible. Applying the optimum parameter set it was possible to grow GaN single crystals and free‐standing GaN with a thickness of 0.1 mm. Pure hexagonal GaN was confirmed by XRD and EDX measurements, neither a cubic phase content nor any other binary or ternary phase was found, which is in agreement with the Raman spectroscopy data and the results from cathodoluminescence and PL measurements. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
ISSN:1610-1634
1610-1642
DOI:10.1002/pssc.200461473