Characterization of MoSe2(0001) and ion-sputtered MoSe2 by XPS

The objective of the present study is to present and interpret X-ray photoelectron spectroscopy (XPS) data of MoSe2(0001) and ion-sputtered MoSe2(0001) to deduce the surface chemistry of well-defined and defective surfaces. This characterization information will not only fill the current information...

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Veröffentlicht in:	Journal of materials science 2005-05, Vol.40 (9-10), p.2679-2681
Hauptverfasser:	ABDALLAH, Wael A, NELSON, A. E
Format:	Artikel
Sprache:	eng
Schlagworte:	Catalysis Catalysts: preparations and properties Chemistry Clean metal, semiconductor, and insulator surfaces Condensed matter: electronic structure, electrical, magnetic, and optical properties Electron and ion emission by liquids and solids impact phenomena Exact sciences and technology General and physical chemistry Molybdenum compounds Photoemission and photoelectron spectra Physics Theory of reactions, general kinetics. Catalysis. Nomenclature, chemical documentation, computer chemistry
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Beschreibung
Zusammenfassung:	The objective of the present study is to present and interpret X-ray photoelectron spectroscopy (XPS) data of MoSe2(0001) and ion-sputtered MoSe2(0001) to deduce the surface chemistry of well-defined and defective surfaces. This characterization information will not only fill the current information gap, but also provide an indication whether MoSe2 may be a potential candidate as a hydrotreating catalyst. Molybdenum selenide (0001) single crystals were obtained from Matek GmbH 1 (Julich, Germany) and used as received.
ISSN:	0022-2461 1573-4803
DOI:	10.1007/s10853-005-2104-7