A novel MESFET fabricated by a simple internal interconnection technique

A new type of internal interconnection of devices has been developed by implanting a buried horizontal n/sup +/ layer and vertical n/sup +/ columns inside semi-insulating GaAs. Based on this technique, a novel MESFET with small intrinsic gate-source resistance has been fabricated and tested.< >...

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Veröffentlicht in:IEEE transactions on electron devices 1995-02, Vol.42 (2), p.370-372
Hauptverfasser: Han Dejun, Chan, K.T., Li GuoHui, Wang WenXun, En-Jun Zhu
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container_issue 2
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container_title IEEE transactions on electron devices
container_volume 42
creator Han Dejun
Chan, K.T.
Li GuoHui
Wang WenXun
En-Jun Zhu
description A new type of internal interconnection of devices has been developed by implanting a buried horizontal n/sup +/ layer and vertical n/sup +/ columns inside semi-insulating GaAs. Based on this technique, a novel MESFET with small intrinsic gate-source resistance has been fabricated and tested.< >
doi_str_mv 10.1109/16.370051
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subjects Applied sciences
Electronics
Etching
Exact sciences and technology
Fabrication
Gallium arsenide
Implants
Integrated circuit interconnections
Integrated circuit technology
MESFETs
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Substrates
Testing
Transistors
Tungsten
title A novel MESFET fabricated by a simple internal interconnection technique
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