A novel MESFET fabricated by a simple internal interconnection technique
A new type of internal interconnection of devices has been developed by implanting a buried horizontal n/sup +/ layer and vertical n/sup +/ columns inside semi-insulating GaAs. Based on this technique, a novel MESFET with small intrinsic gate-source resistance has been fabricated and tested.< >...
Gespeichert in:
Veröffentlicht in: | IEEE transactions on electron devices 1995-02, Vol.42 (2), p.370-372 |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 372 |
---|---|
container_issue | 2 |
container_start_page | 370 |
container_title | IEEE transactions on electron devices |
container_volume | 42 |
creator | Han Dejun Chan, K.T. Li GuoHui Wang WenXun En-Jun Zhu |
description | A new type of internal interconnection of devices has been developed by implanting a buried horizontal n/sup +/ layer and vertical n/sup +/ columns inside semi-insulating GaAs. Based on this technique, a novel MESFET with small intrinsic gate-source resistance has been fabricated and tested.< > |
doi_str_mv | 10.1109/16.370051 |
format | Article |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_28453826</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>370051</ieee_id><sourcerecordid>28453826</sourcerecordid><originalsourceid>FETCH-LOGICAL-c306t-36f9416529b29c25008f39248922c22d8faa4554159da7fff7f995617da6f05b3</originalsourceid><addsrcrecordid>eNpFkE1LAzEQhoMoWKsHr55yEMHD1nxvciylWqHiQT2HbDbBSJqtyVbov3fLFj3NDPPMM_ACcI3RDGOkHrCY0Rohjk_ABHNeV0owcQomCGFZKSrpObgo5WsYBWNkAlZzmLofF-HL8u1x-Q69aXKwpnctbPbQwBI22-hgSL3LycSxsV1KzvahS7B39jOF7527BGfexOKujnUKPgbfYlWtX5-eF_N1ZSkSfUWFVwwLTlRDlCUcIempIkwqQiwhrfTGMM4Z5qo1tfe-9kpxgevWCI94Q6fgbvRucze8Lb3ehGJdjCa5blc0kYxTScQA3o-gzV0p2Xm9zWFj8l5jpA9ZaSz0mNXA3h6lplgTfTbJhvJ3QOmQnDwob0YsOOf-t6PjF1kabvg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>28453826</pqid></control><display><type>article</type><title>A novel MESFET fabricated by a simple internal interconnection technique</title><source>IEEE</source><creator>Han Dejun ; Chan, K.T. ; Li GuoHui ; Wang WenXun ; En-Jun Zhu</creator><creatorcontrib>Han Dejun ; Chan, K.T. ; Li GuoHui ; Wang WenXun ; En-Jun Zhu</creatorcontrib><description>A new type of internal interconnection of devices has been developed by implanting a buried horizontal n/sup +/ layer and vertical n/sup +/ columns inside semi-insulating GaAs. Based on this technique, a novel MESFET with small intrinsic gate-source resistance has been fabricated and tested.< ></description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/16.370051</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Electronics ; Etching ; Exact sciences and technology ; Fabrication ; Gallium arsenide ; Implants ; Integrated circuit interconnections ; Integrated circuit technology ; MESFETs ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Substrates ; Testing ; Transistors ; Tungsten</subject><ispartof>IEEE transactions on electron devices, 1995-02, Vol.42 (2), p.370-372</ispartof><rights>1995 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c306t-36f9416529b29c25008f39248922c22d8faa4554159da7fff7f995617da6f05b3</citedby><cites>FETCH-LOGICAL-c306t-36f9416529b29c25008f39248922c22d8faa4554159da7fff7f995617da6f05b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/370051$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/370051$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=3393886$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Han Dejun</creatorcontrib><creatorcontrib>Chan, K.T.</creatorcontrib><creatorcontrib>Li GuoHui</creatorcontrib><creatorcontrib>Wang WenXun</creatorcontrib><creatorcontrib>En-Jun Zhu</creatorcontrib><title>A novel MESFET fabricated by a simple internal interconnection technique</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description>A new type of internal interconnection of devices has been developed by implanting a buried horizontal n/sup +/ layer and vertical n/sup +/ columns inside semi-insulating GaAs. Based on this technique, a novel MESFET with small intrinsic gate-source resistance has been fabricated and tested.< ></description><subject>Applied sciences</subject><subject>Electronics</subject><subject>Etching</subject><subject>Exact sciences and technology</subject><subject>Fabrication</subject><subject>Gallium arsenide</subject><subject>Implants</subject><subject>Integrated circuit interconnections</subject><subject>Integrated circuit technology</subject><subject>MESFETs</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Substrates</subject><subject>Testing</subject><subject>Transistors</subject><subject>Tungsten</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1995</creationdate><recordtype>article</recordtype><recordid>eNpFkE1LAzEQhoMoWKsHr55yEMHD1nxvciylWqHiQT2HbDbBSJqtyVbov3fLFj3NDPPMM_ACcI3RDGOkHrCY0Rohjk_ABHNeV0owcQomCGFZKSrpObgo5WsYBWNkAlZzmLofF-HL8u1x-Q69aXKwpnctbPbQwBI22-hgSL3LycSxsV1KzvahS7B39jOF7527BGfexOKujnUKPgbfYlWtX5-eF_N1ZSkSfUWFVwwLTlRDlCUcIempIkwqQiwhrfTGMM4Z5qo1tfe-9kpxgevWCI94Q6fgbvRucze8Lb3ehGJdjCa5blc0kYxTScQA3o-gzV0p2Xm9zWFj8l5jpA9ZaSz0mNXA3h6lplgTfTbJhvJ3QOmQnDwob0YsOOf-t6PjF1kabvg</recordid><startdate>19950201</startdate><enddate>19950201</enddate><creator>Han Dejun</creator><creator>Chan, K.T.</creator><creator>Li GuoHui</creator><creator>Wang WenXun</creator><creator>En-Jun Zhu</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19950201</creationdate><title>A novel MESFET fabricated by a simple internal interconnection technique</title><author>Han Dejun ; Chan, K.T. ; Li GuoHui ; Wang WenXun ; En-Jun Zhu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c306t-36f9416529b29c25008f39248922c22d8faa4554159da7fff7f995617da6f05b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1995</creationdate><topic>Applied sciences</topic><topic>Electronics</topic><topic>Etching</topic><topic>Exact sciences and technology</topic><topic>Fabrication</topic><topic>Gallium arsenide</topic><topic>Implants</topic><topic>Integrated circuit interconnections</topic><topic>Integrated circuit technology</topic><topic>MESFETs</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Substrates</topic><topic>Testing</topic><topic>Transistors</topic><topic>Tungsten</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Han Dejun</creatorcontrib><creatorcontrib>Chan, K.T.</creatorcontrib><creatorcontrib>Li GuoHui</creatorcontrib><creatorcontrib>Wang WenXun</creatorcontrib><creatorcontrib>En-Jun Zhu</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Han Dejun</au><au>Chan, K.T.</au><au>Li GuoHui</au><au>Wang WenXun</au><au>En-Jun Zhu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A novel MESFET fabricated by a simple internal interconnection technique</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>1995-02-01</date><risdate>1995</risdate><volume>42</volume><issue>2</issue><spage>370</spage><epage>372</epage><pages>370-372</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract>A new type of internal interconnection of devices has been developed by implanting a buried horizontal n/sup +/ layer and vertical n/sup +/ columns inside semi-insulating GaAs. Based on this technique, a novel MESFET with small intrinsic gate-source resistance has been fabricated and tested.< ></abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/16.370051</doi><tpages>3</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 0018-9383 |
ispartof | IEEE transactions on electron devices, 1995-02, Vol.42 (2), p.370-372 |
issn | 0018-9383 1557-9646 |
language | eng |
recordid | cdi_proquest_miscellaneous_28453826 |
source | IEEE |
subjects | Applied sciences Electronics Etching Exact sciences and technology Fabrication Gallium arsenide Implants Integrated circuit interconnections Integrated circuit technology MESFETs Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Substrates Testing Transistors Tungsten |
title | A novel MESFET fabricated by a simple internal interconnection technique |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T14%3A20%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20novel%20MESFET%20fabricated%20by%20a%20simple%20internal%20interconnection%20technique&rft.jtitle=IEEE%20transactions%20on%20electron%20devices&rft.au=Han%20Dejun&rft.date=1995-02-01&rft.volume=42&rft.issue=2&rft.spage=370&rft.epage=372&rft.pages=370-372&rft.issn=0018-9383&rft.eissn=1557-9646&rft.coden=IETDAI&rft_id=info:doi/10.1109/16.370051&rft_dat=%3Cproquest_RIE%3E28453826%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=28453826&rft_id=info:pmid/&rft_ieee_id=370051&rfr_iscdi=true |