Ion-induced sustained high current condition in a bipolar device

Observation of an ion-induced sustained high current condition ("high current anomaly") in a bipolar device, that is similar but not identical to latchup, is reported. Both high current anomaly and single event upset test results are presented for the AD9048 test device. Photon emission mi...

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Veröffentlicht in:	IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) 1994-12, Vol.41 (6), p.2172-2178
Hauptverfasser:	Koga, R., Ferro, R.J., Mabry, D.J., Pinkerton, S.D., Romeo, D.E., Scarpulla, J.R., Tsubota, T.K., Shoga, M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Analog-digital conversion ANALOG-TO-DIGITAL CONVERTERS Applied sciences Circuit testing Clocks Computer errors CURRENTS Cyclotrons DATA ELECTRIC CURRENTS ELECTRONIC EQUIPMENT Electronics Exact sciences and technology EXPERIMENTAL DATA INFORMATION INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY Ion beams IRRADIATION Laboratories MATHEMATICAL MODELS Microscopy NUMERICAL DATA PERFORMANCE TESTING PHYSICAL RADIATION EFFECTS RADIATION EFFECTS Single event upset TESTING 440200 > Radiation Effects on Instrument Components, Instruments, or Electronic Systems Testing, measurement, noise and reliability Thyristor circuits
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Zusammenfassung:	Observation of an ion-induced sustained high current condition ("high current anomaly") in a bipolar device, that is similar but not identical to latchup, is reported. Both high current anomaly and single event upset test results are presented for the AD9048 test device. Photon emission microscopy was used to locate the site of the high current anomaly. A model of the triggering mechanism based on the results so obtained is described.< >
ISSN:	0018-9499 1558-1578
DOI:	10.1109/23.340559