An Improved Interferometric Polarization Analyzer for Measuring the Microwave Magneto-Kerr Effect in Semiconductors
An interferometric polarization analyzer for measuring the microwave magneto-Kerr effect in semiconductors is described and analyzed, and compared with earlier systems used for the same purpose. The system described utilizes a 4-port waveguide junction referred to as a dual-mode transducer (DMT). Th...
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| Veröffentlicht in: | IEEE transactions on microwave theory and techniques 1971-03, Vol.19 (3), p.287-294 |
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| container_end_page | 294 |
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| container_issue | 3 |
| container_start_page | 287 |
| container_title | IEEE transactions on microwave theory and techniques |
| container_volume | 19 |
| creator | Vernon, R.J. Dorschner, T.A. |
| description | An interferometric polarization analyzer for measuring the microwave magneto-Kerr effect in semiconductors is described and analyzed, and compared with earlier systems used for the same purpose. The system described utilizes a 4-port waveguide junction referred to as a dual-mode transducer (DMT). This system has important advantages over systems previously used to measure the microwave magneto-Kerr effect. Preliminary data taken with the system are presented and sources of error discussed. |
| doi_str_mv | 10.1109/TMTT.1971.1127502 |
| format | Article |
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The system described utilizes a 4-port waveguide junction referred to as a dual-mode transducer (DMT). This system has important advantages over systems previously used to measure the microwave magneto-Kerr effect. 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The system described utilizes a 4-port waveguide junction referred to as a dual-mode transducer (DMT). This system has important advantages over systems previously used to measure the microwave magneto-Kerr effect. Preliminary data taken with the system are presented and sources of error discussed.</description><subject>Electromagnetic wave polarization</subject><subject>Faraday effect</subject><subject>Magnetic analysis</subject><subject>Magnetic field measurement</subject><subject>Magnetic semiconductors</subject><subject>Microwave measurements</subject><subject>OFDM modulation</subject><subject>Semiconductor waveguides</subject><subject>Transducers</subject><subject>Waveguide junctions</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1971</creationdate><recordtype>article</recordtype><recordid>eNqNkU9LAzEQxYMoWKsfQLzk5G11Jrvb3RxL8U_RomA9L2l2tkZ2k5qkSvvp3dKCV08zj_m9gcdj7BLhBhHk7Xw2n9-gLLCXoshBHLEB5nmRyFEBx2wAgGUisxJO2VkIn73McigHLIwtn3Yr776p5lMbyTfkXUfRG81fXau82aponOVjq9rNljxvnOczUmHtjV3y-EF8ZrR3P-q739TSUnTJE3nP75qGdOTG8jfqjHa2XuvofDhnJ41qA10c5pC939_NJ4_J88vDdDJ-TnQq8phoWYDSEiTWi1EGqkZEWqhciQWWpUqFlnIxSkUKoLO0RqhHAusMU8w1CaXSIbve_-3jfa0pxKozQVPbKktuHSpRyiLNRfYPMMtEAdCDuAf7vCF4aqqVN53ymwqh2vVQ7Xqodj1Uhx56z9XeY4jojz9cfwE9YIWl</recordid><startdate>19710301</startdate><enddate>19710301</enddate><creator>Vernon, R.J.</creator><creator>Dorschner, T.A.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>7U5</scope></search><sort><creationdate>19710301</creationdate><title>An Improved Interferometric Polarization Analyzer for Measuring the Microwave Magneto-Kerr Effect in Semiconductors</title><author>Vernon, R.J. ; Dorschner, T.A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c325t-c970ac9091db640ad111eba5a2b188a32c99b632300c43d10d621d41315ce2aa3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1971</creationdate><topic>Electromagnetic wave polarization</topic><topic>Faraday effect</topic><topic>Magnetic analysis</topic><topic>Magnetic field measurement</topic><topic>Magnetic semiconductors</topic><topic>Microwave measurements</topic><topic>OFDM modulation</topic><topic>Semiconductor waveguides</topic><topic>Transducers</topic><topic>Waveguide junctions</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Vernon, R.J.</creatorcontrib><creatorcontrib>Dorschner, T.A.</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Solid State and Superconductivity Abstracts</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Vernon, R.J.</au><au>Dorschner, T.A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An Improved Interferometric Polarization Analyzer for Measuring the Microwave Magneto-Kerr Effect in Semiconductors</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>1971-03-01</date><risdate>1971</risdate><volume>19</volume><issue>3</issue><spage>287</spage><epage>294</epage><pages>287-294</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>An interferometric polarization analyzer for measuring the microwave magneto-Kerr effect in semiconductors is described and analyzed, and compared with earlier systems used for the same purpose. The system described utilizes a 4-port waveguide junction referred to as a dual-mode transducer (DMT). This system has important advantages over systems previously used to measure the microwave magneto-Kerr effect. Preliminary data taken with the system are presented and sources of error discussed.</abstract><pub>IEEE</pub><doi>10.1109/TMTT.1971.1127502</doi><tpages>8</tpages></addata></record> |
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| identifier | ISSN: 0018-9480 |
| ispartof | IEEE transactions on microwave theory and techniques, 1971-03, Vol.19 (3), p.287-294 |
| issn | 0018-9480 1557-9670 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_28442700 |
| source | IEEE/IET Electronic Library (IEL) |
| subjects | Electromagnetic wave polarization Faraday effect Magnetic analysis Magnetic field measurement Magnetic semiconductors Microwave measurements OFDM modulation Semiconductor waveguides Transducers Waveguide junctions |
| title | An Improved Interferometric Polarization Analyzer for Measuring the Microwave Magneto-Kerr Effect in Semiconductors |
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