An Improved Interferometric Polarization Analyzer for Measuring the Microwave Magneto-Kerr Effect in Semiconductors

An Improved Interferometric Polarization Analyzer for Measuring the Microwave Magneto-Kerr Effect in Semiconductors

An interferometric polarization analyzer for measuring the microwave magneto-Kerr effect in semiconductors is described and analyzed, and compared with earlier systems used for the same purpose. The system described utilizes a 4-port waveguide junction referred to as a dual-mode transducer (DMT). Th...

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Veröffentlicht in:IEEE transactions on microwave theory and techniques 1971-03, Vol.19 (3), p.287-294
Hauptverfasser: Vernon, R.J., Dorschner, T.A.
Format: Artikel
Sprache:eng
Schlagworte:
Electromagnetic wave polarization
Faraday effect
Magnetic analysis
Magnetic field measurement
Magnetic semiconductors
Microwave measurements
OFDM modulation
Semiconductor waveguides
Transducers
Waveguide junctions
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Zusammenfassung:An interferometric polarization analyzer for measuring the microwave magneto-Kerr effect in semiconductors is described and analyzed, and compared with earlier systems used for the same purpose. The system described utilizes a 4-port waveguide junction referred to as a dual-mode transducer (DMT). This system has important advantages over systems previously used to measure the microwave magneto-Kerr effect. Preliminary data taken with the system are presented and sources of error discussed.
ISSN:0018-9480
1557-9670
DOI:10.1109/TMTT.1971.1127502