The preparation of nanograin Ag–TCNQ thin films by vacuum evaporation with post-heat treatment

Ag–TCNQ organometallic complex with single phase and uniform grains in nanometer scale were prepared by vacuum evaporation and post-heat treatment. The grain size of the films was decreased by introducing the post-heat treatment process to about 50 nm. By applying a ramp voltage onto the film through STM probe tip in air at room temperature, the film will transfer from high impedence to low impedence at about 2.0 V. A writing dot of about 70 nm in diameter, corresponding to the low impedence state, was obtained after applying a pulse voltage of 5.0 V in amplitude and 5.0 ms in duration.