Energy-resolved neutron SEU measurements from 22 to 160 MeV

The energy dependence of the neutron-induced single-event upset (NSEU) cross section for Static RAMs have been measured, using quasi-monoenergetic neutrons of five different energies from 22 to 160 MeV. The measured SEU cross sections were corrected for the low-energy neutron tail by an iterative fo...

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Veröffentlicht in:	IEEE Transactions on Nuclear Science 1998-12, Vol.45 (6), p.2519-2526
Hauptverfasser:	Johansson, K., Dyreklev, P., Granbom, B., Olsson, N., Blomgren, J., Renberg, P.-U.
Format:	Artikel
Sprache:	eng
Schlagworte:	Aerospace electronics Collimators Electromagnetic measurements ENERGY DEPENDENCE Energy measurement ERRORS INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS Lithium MEV RANGE 10-100 MEV RANGE 100-1000 NEUTRONS Particle beams PHYSICAL RADIATION EFFECTS SEMICONDUCTOR STORAGE DEVICES Single event upset Spectroscopy Testing
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Beschreibung
Zusammenfassung:	The energy dependence of the neutron-induced single-event upset (NSEU) cross section for Static RAMs have been measured, using quasi-monoenergetic neutrons of five different energies from 22 to 160 MeV. The measured SEU cross sections were corrected for the low-energy neutron tail by an iterative folding procedure. A clear energy dependence has been found. The SEU rate has been compared both with results from testing with a neutron spallation spectrum up to 800 MeV and the measured SEU rate from In-Flight experiments at 20 km.
ISSN:	0018-9499 1558-1578
DOI:	10.1109/23.736493