A nonparametric approach to estimate system burn-in time
System burn-in can get rid of more residual defects than component and subsystem burn-ins because incompatibility exists not only among components, but also among different subsystems and at the system level. There are two major disadvantages for performing the system burn-in: the high burn-in cost...
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Veröffentlicht in: | IEEE transactions on semiconductor manufacturing 1996-08, Vol.9 (3), p.461-467 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | System burn-in can get rid of more residual defects than component and subsystem burn-ins because incompatibility exists not only among components, but also among different subsystems and at the system level. There are two major disadvantages for performing the system burn-in: the high burn-in cost and the complicated failure rate function. This paper proposes a nonparametric approach to estimate the optimal system burn-in time. The Anderson-Darling statistic is used to check the constant failure rate (CFR), and the pool-adjacent-violator (PAV) algorithm is applied to "unimodalize" the failure rate curve. Given experimental data, the system burn-in time can be determined easily without going through complex parameter estimation and curve fittings. |
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ISSN: | 0894-6507 1558-2345 |
DOI: | 10.1109/66.536117 |