A nonparametric approach to estimate system burn-in time

System burn-in can get rid of more residual defects than component and subsystem burn-ins because incompatibility exists not only among components, but also among different subsystems and at the system level. There are two major disadvantages for performing the system burn-in: the high burn-in cost...

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Veröffentlicht in:IEEE transactions on semiconductor manufacturing 1996-08, Vol.9 (3), p.461-467
Hauptverfasser: KARY CHIEN, W.-T, KUO, W
Format: Artikel
Sprache:eng
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Zusammenfassung:System burn-in can get rid of more residual defects than component and subsystem burn-ins because incompatibility exists not only among components, but also among different subsystems and at the system level. There are two major disadvantages for performing the system burn-in: the high burn-in cost and the complicated failure rate function. This paper proposes a nonparametric approach to estimate the optimal system burn-in time. The Anderson-Darling statistic is used to check the constant failure rate (CFR), and the pool-adjacent-violator (PAV) algorithm is applied to "unimodalize" the failure rate curve. Given experimental data, the system burn-in time can be determined easily without going through complex parameter estimation and curve fittings.
ISSN:0894-6507
1558-2345
DOI:10.1109/66.536117