Schottky barrier and ageing effect studies in Au(Cu)/p-CdTe contacts

The Schottky barrier formation are investigated in Au(Cu)/p‐CdTe contacts prepared by electroless deposition of metals on chemically etched surfaces. The Schottky barrier height are studied in freshly prepared contacts as well as stored under normal laboratory condition during one‐year period. The potential barrier height is determined from the photoemission current spectra measurements. The secondary ion‐mass spectroscopy (SIMS) profiling has been carried out to study the compositional structure in the contacts. The effect of thermal annealing on electrical and photoelectrical properties of the contacts was studied. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)