A least-squares approach to analyzing life-stress relationship in step-stress accelerated life tests
A new approach is proposed for the data analysis of failure-censored step-stress accelerated life tests with exponential failures, following an assumed log-linear life-stress relationship. This approach, transformed least squares: (1) provides closed-form parameter estimates; (2) motivates a simple...
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| Veröffentlicht in: | IEEE transactions on reliability 2002-06, Vol.51 (2), p.177-182 |
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| container_title | IEEE transactions on reliability |
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| creator | Teng, Siew-Leng Yeo, Kwee-Poo |
| description | A new approach is proposed for the data analysis of failure-censored step-stress accelerated life tests with exponential failures, following an assumed log-linear life-stress relationship. This approach, transformed least squares: (1) provides closed-form parameter estimates; (2) motivates a simple statistic for life-stress relationship verification; and (3) appreciably simplifies the derivation of optimal test plans. The proposed D-statistic has good power and compares reasonably well with likelihood-ratio test statistic. Estimates are unbiased and exact for failure-step tests of any sample size. The derived optimal test plans agree with those derived using maximum likelihood estimation. |
| doi_str_mv | 10.1109/TR.2002.1011523 |
| format | Article |
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This approach, transformed least squares: (1) provides closed-form parameter estimates; (2) motivates a simple statistic for life-stress relationship verification; and (3) appreciably simplifies the derivation of optimal test plans. The proposed D-statistic has good power and compares reasonably well with likelihood-ratio test statistic. Estimates are unbiased and exact for failure-step tests of any sample size. The derived optimal test plans agree with those derived using maximum likelihood estimation.</description><identifier>ISSN: 0018-9529</identifier><identifier>EISSN: 1558-1721</identifier><identifier>DOI: 10.1109/TR.2002.1011523</identifier><identifier>CODEN: IERQAD</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Accelerated life tests ; Data analysis ; Derivation ; Estimates ; Exact solutions ; Exponential distribution ; Least squares approximation ; Least squares method ; Life estimation ; Life testing ; Mathematical analysis ; Maximum likelihood estimation ; Optimization ; Parameter estimation ; Statistical analysis ; Statistical distributions ; Statistics ; Stress</subject><ispartof>IEEE transactions on reliability, 2002-06, Vol.51 (2), p.177-182</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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This approach, transformed least squares: (1) provides closed-form parameter estimates; (2) motivates a simple statistic for life-stress relationship verification; and (3) appreciably simplifies the derivation of optimal test plans. The proposed D-statistic has good power and compares reasonably well with likelihood-ratio test statistic. Estimates are unbiased and exact for failure-step tests of any sample size. The derived optimal test plans agree with those derived using maximum likelihood estimation.</description><subject>Accelerated life tests</subject><subject>Data analysis</subject><subject>Derivation</subject><subject>Estimates</subject><subject>Exact solutions</subject><subject>Exponential distribution</subject><subject>Least squares approximation</subject><subject>Least squares method</subject><subject>Life estimation</subject><subject>Life testing</subject><subject>Mathematical analysis</subject><subject>Maximum likelihood estimation</subject><subject>Optimization</subject><subject>Parameter estimation</subject><subject>Statistical analysis</subject><subject>Statistical distributions</subject><subject>Statistics</subject><subject>Stress</subject><issn>0018-9529</issn><issn>1558-1721</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqFkTFPHDEQhS0UJC5ATZHGShGl2cNjr9d2iVACSEiRTkdt-byzYdGyu3h8Bfz6-DiQohSh8ch635ux5zF2BmIJINz5erWUQsglCAAt1QFbgNa2AiPhE1sIAbZyWroj9pnooVzr2tkFay_4gIFyRU_bkJB4mOc0hXjP88TDGIbnl378zYe-w4pyAYgnHELup5Hu-5n3I6eM87sWYsQBU8jYvnp4Rsp0wg67MBCevtVjdvfzx_ryurr9dXVzeXFbxRpkrmzQ2rVab5y1CMa1RqBR2EZhnI1iYzCapkPsQGrVOQU1ah3LqcBJbaU6Zt_2fcsXnrZlsn_sqTxoCCNOW_LSyUY21n0MWtVYo83HoAEHolYF_P5fEBoDSrpG64J-_Qd9mLaprJq8tbUWrja7fud7KKaJKGHn59Q_hvTsQfhd3n698ru8_VvexfFl7-gR8S96r_4BzNaljg</recordid><startdate>20020601</startdate><enddate>20020601</enddate><creator>Teng, Siew-Leng</creator><creator>Yeo, Kwee-Poo</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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This approach, transformed least squares: (1) provides closed-form parameter estimates; (2) motivates a simple statistic for life-stress relationship verification; and (3) appreciably simplifies the derivation of optimal test plans. The proposed D-statistic has good power and compares reasonably well with likelihood-ratio test statistic. Estimates are unbiased and exact for failure-step tests of any sample size. The derived optimal test plans agree with those derived using maximum likelihood estimation.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TR.2002.1011523</doi><tpages>6</tpages></addata></record> |
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| source | IEL |
| subjects | Accelerated life tests Data analysis Derivation Estimates Exact solutions Exponential distribution Least squares approximation Least squares method Life estimation Life testing Mathematical analysis Maximum likelihood estimation Optimization Parameter estimation Statistical analysis Statistical distributions Statistics Stress |
| title | A least-squares approach to analyzing life-stress relationship in step-stress accelerated life tests |
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