A least-squares approach to analyzing life-stress relationship in step-stress accelerated life tests

A new approach is proposed for the data analysis of failure-censored step-stress accelerated life tests with exponential failures, following an assumed log-linear life-stress relationship. This approach, transformed least squares: (1) provides closed-form parameter estimates; (2) motivates a simple...

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Veröffentlicht in:IEEE transactions on reliability 2002-06, Vol.51 (2), p.177-182
Hauptverfasser: Teng, Siew-Leng, Yeo, Kwee-Poo
Format: Artikel
Sprache:eng
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Zusammenfassung:A new approach is proposed for the data analysis of failure-censored step-stress accelerated life tests with exponential failures, following an assumed log-linear life-stress relationship. This approach, transformed least squares: (1) provides closed-form parameter estimates; (2) motivates a simple statistic for life-stress relationship verification; and (3) appreciably simplifies the derivation of optimal test plans. The proposed D-statistic has good power and compares reasonably well with likelihood-ratio test statistic. Estimates are unbiased and exact for failure-step tests of any sample size. The derived optimal test plans agree with those derived using maximum likelihood estimation.
ISSN:0018-9529
1558-1721
DOI:10.1109/TR.2002.1011523