A least-squares approach to analyzing life-stress relationship in step-stress accelerated life tests
A new approach is proposed for the data analysis of failure-censored step-stress accelerated life tests with exponential failures, following an assumed log-linear life-stress relationship. This approach, transformed least squares: (1) provides closed-form parameter estimates; (2) motivates a simple...
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Veröffentlicht in: | IEEE transactions on reliability 2002-06, Vol.51 (2), p.177-182 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | A new approach is proposed for the data analysis of failure-censored step-stress accelerated life tests with exponential failures, following an assumed log-linear life-stress relationship. This approach, transformed least squares: (1) provides closed-form parameter estimates; (2) motivates a simple statistic for life-stress relationship verification; and (3) appreciably simplifies the derivation of optimal test plans. The proposed D-statistic has good power and compares reasonably well with likelihood-ratio test statistic. Estimates are unbiased and exact for failure-step tests of any sample size. The derived optimal test plans agree with those derived using maximum likelihood estimation. |
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ISSN: | 0018-9529 1558-1721 |
DOI: | 10.1109/TR.2002.1011523 |