A high frequency model based on the physical structure of the ceramic multilayer capacitor

Modeling of the high-frequency behavior of ceramic multilayer capacitors based on device physics is presented. An accurate predictive model incorporating physical dimensions, material constants, and aspects of the CMC application environment is presented. This model is suitable for use in the design...

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Veröffentlicht in:IEEE transactions on microwave theory and techniques 1992-07, Vol.40 (7), p.1584-1587
Hauptverfasser: de Vreede, L.C.N., de Kok, M., van Dam, C., Tauritz, J.L.
Format: Artikel
Sprache:eng
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Zusammenfassung:Modeling of the high-frequency behavior of ceramic multilayer capacitors based on device physics is presented. An accurate predictive model incorporating physical dimensions, material constants, and aspects of the CMC application environment is presented. This model is suitable for use in the design and development of improved high frequency CMC structures.< >
ISSN:0018-9480
1557-9670
DOI:10.1109/22.146342