A Ka-band GaAs monolithic phase shifter

The design and performance of a GaAs monolithic 180° one-bit switched line phase shifter test circuit for Ka -band operation is presented. A self-aligned gate (SAG) fabrication technique is also described that reduces resistive parasitics in the switching FET's. Over the 27.5-30 GHz band, typic...

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Veröffentlicht in:IEEE transactions on electron devices 1983-12, Vol.30 (12), p.1855-1861
Hauptverfasser: Sokolov, V., Geddes, J.J., Contolatis, A., Bauhahn, P.E., Chente Chao
Format: Artikel
Sprache:eng
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Zusammenfassung:The design and performance of a GaAs monolithic 180° one-bit switched line phase shifter test circuit for Ka -band operation is presented. A self-aligned gate (SAG) fabrication technique is also described that reduces resistive parasitics in the switching FET's. Over the 27.5-30 GHz band, typical measured differential insertion phase is within 10-20° of the ideal time delay characteristic. Over the same band, the insertion loss for the SAG phase shifter is about 2.5-3 dB per bit. The SAG fabrication technique holds promise in reducing phase shifter insertion loss to about 1.5 dB/bit for 30-GHz operation.
ISSN:0018-9383
1557-9646
DOI:10.1109/T-ED.1983.21461