A Ka-band GaAs monolithic phase shifter
The design and performance of a GaAs monolithic 180° one-bit switched line phase shifter test circuit for Ka -band operation is presented. A self-aligned gate (SAG) fabrication technique is also described that reduces resistive parasitics in the switching FET's. Over the 27.5-30 GHz band, typic...
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Veröffentlicht in: | IEEE transactions on electron devices 1983-12, Vol.30 (12), p.1855-1861 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The design and performance of a GaAs monolithic 180° one-bit switched line phase shifter test circuit for Ka -band operation is presented. A self-aligned gate (SAG) fabrication technique is also described that reduces resistive parasitics in the switching FET's. Over the 27.5-30 GHz band, typical measured differential insertion phase is within 10-20° of the ideal time delay characteristic. Over the same band, the insertion loss for the SAG phase shifter is about 2.5-3 dB per bit. The SAG fabrication technique holds promise in reducing phase shifter insertion loss to about 1.5 dB/bit for 30-GHz operation. |
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ISSN: | 0018-9383 1557-9646 |
DOI: | 10.1109/T-ED.1983.21461 |