Electron saturation velocity variation in InGaAs and GaAs channelMODFETs for gate length to 550 A
MODFETs with InGaAs and GaAs channels have been fabricated with gate lengths between 2 mum and 550 A and have been DC characterized at room temperature. An effective electron saturation velocity was calculated for each device from the peak transconductance. The GaAs channel devices show a peak in th...
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Veröffentlicht in: | IEEE electron device letters 1988-03, Vol.9 (3), p.148-150 |
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Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | MODFETs with InGaAs and GaAs channels have been fabricated with gate lengths between 2 mum and 550 A and have been DC characterized at room temperature. An effective electron saturation velocity was calculated for each device from the peak transconductance. The GaAs channel devices show a peak in the transconductance and saturation velocity at a gate length of approximately 0.15 mum, while the transconductance and velocity of the InGaAs channel devices are nearly constant over the entire range of gate lengths |
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ISSN: | 0741-3106 |
DOI: | 10.1109/55.2071 |