Electron saturation velocity variation in InGaAs and GaAs channelMODFETs for gate length to 550 A

MODFETs with InGaAs and GaAs channels have been fabricated with gate lengths between 2 mum and 550 A and have been DC characterized at room temperature. An effective electron saturation velocity was calculated for each device from the peak transconductance. The GaAs channel devices show a peak in th...

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Veröffentlicht in:IEEE electron device letters 1988-03, Vol.9 (3), p.148-150
Hauptverfasser: de la Houssaye, P R, Allee, D R, Pao, Y, Schlom, D G, Harris, J S, Pease, R F W
Format: Artikel
Sprache:eng
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Zusammenfassung:MODFETs with InGaAs and GaAs channels have been fabricated with gate lengths between 2 mum and 550 A and have been DC characterized at room temperature. An effective electron saturation velocity was calculated for each device from the peak transconductance. The GaAs channel devices show a peak in the transconductance and saturation velocity at a gate length of approximately 0.15 mum, while the transconductance and velocity of the InGaAs channel devices are nearly constant over the entire range of gate lengths
ISSN:0741-3106
DOI:10.1109/55.2071