High-performance large-area InGaAs MSM photodetectors with a pseudomorphic InGaP cap layer

We report the fabrication and characteristics of high-performance InGaAs MSM photodetectors with a 300-μm×300-μm square and a 300-μm-diameter circular detection area. With a pseudomorphic In/sub 0.9/Ga/sub 0.1/P cap layer, the detectors exhibit dark current densities less than 1 pA/μ on finger spaci...

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Veröffentlicht in:IEEE photonics technology letters 1995-08, Vol.7 (8), p.914-916
Hauptverfasser: Yuang, Rong-Heng, Shieh, Hung-Chang, Chien, Yi-Jiunn, Chan, Yi-Jen, Chyi, Jen-Inn, Lin, Wei, Tu, Yuan-Kuang
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container_end_page 916
container_issue 8
container_start_page 914
container_title IEEE photonics technology letters
container_volume 7
creator Yuang, Rong-Heng
Shieh, Hung-Chang
Chien, Yi-Jiunn
Chan, Yi-Jen
Chyi, Jen-Inn
Lin, Wei
Tu, Yuan-Kuang
description We report the fabrication and characteristics of high-performance InGaAs MSM photodetectors with a 300-μm×300-μm square and a 300-μm-diameter circular detection area. With a pseudomorphic In/sub 0.9/Ga/sub 0.1/P cap layer, the detectors exhibit dark current densities less than 1 pA/μ on finger spacing. Bandwidth over 1 GHz has been obtained for these large-area detectors. Our results also show that the circular detector exhibits better speed performance as compared to the square one due to its smaller parasitic RC constant.
doi_str_mv 10.1109/68.404013
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subjects Applied sciences
Bandwidth
Dark current
Detectors
Electronics
Exact sciences and technology
Fabrication
Fingers
Indium gallium arsenide
Indium phosphide
Laboratories
Optoelectronic devices
Parasitic capacitance
Photodetectors
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
title High-performance large-area InGaAs MSM photodetectors with a pseudomorphic InGaP cap layer
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