Novel method for TEM characterization of deformation under nanoindents in nanolayered materials

Novel method for TEM characterization of deformation under nanoindents in nanolayered materials

Arrays of dislocations and faults have been imaged beneath wedge nanoindents in a W/NbN nanolaminate. Dislocations generated within the W layers crossed the nitride layer as a partial trailing a stacking fault. The gross deformation of the indent was accommodated by slip alone, leaving the lattice u...

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Veröffentlicht in:Scripta materialia 2004-03, Vol.50 (6), p.745-749
Hauptverfasser: Kramer, D.E., Savage, M.F., Lin, A., Foecke, T.
Format: Artikel
Sprache:eng
Schlagworte:
Dislocations
Multilayer
Nanoindentation
Nanolaminate
TEM
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Beschreibung
Zusammenfassung:Arrays of dislocations and faults have been imaged beneath wedge nanoindents in a W/NbN nanolaminate. Dislocations generated within the W layers crossed the nitride layer as a partial trailing a stacking fault. The gross deformation of the indent was accommodated by slip alone, leaving the lattice unrotated beneath the indent.
ISSN:1359-6462
1872-8456
DOI:10.1016/j.scriptamat.2003.11.043