Analysis of Raman spectra of amorphous-nanocrystalline silicon films

Analysis of Raman spectra of amorphous-nanocrystalline silicon films

A new method is proposed for the treatment of Raman spectra of amorphous-nanocrystalline silicon films serving as a major component in solar cells. The method is based on the well-known theory of strong spatial localization (confinement) of phonons and offers the possibility of estimating the fracti...

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Veröffentlicht in:Fizika tverdogo tela 2004-08, Vol.46 (8), p.1528-1532
Hauptverfasser: Gaisler, S. V., Semenova, O. I., Sharafutdinov, R. G., Kolesov, B. A.
Format: Artikel
Sprache:eng
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Zusammenfassung:A new method is proposed for the treatment of Raman spectra of amorphous-nanocrystalline silicon films serving as a major component in solar cells. The method is based on the well-known theory of strong spatial localization (confinement) of phonons and offers the possibility of estimating the fractional content of the amorphous and crystalline phases in a film and the size distribution of nanocrystals.
ISSN:1063-7834
0367-3294
1090-6460
DOI:10.1134/1.1788789