Design considerations and verification testing of an SEE-hardened quad comparator

Design considerations and verification testing of an SEE-hardened quad comparator

Describes design considerations and single-event effect (SEE) testing results of a hardened quad comparator equivalent to the industry standard "139" device. The hardened part uses redundancy and hardened complementary BiCMOS processing to achieve improved SEE performance.

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Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on nuclear science 2001-12, Vol.48 (6), p.1859-1864
Hauptverfasser: van Onno, N.W., Doyle, B.R.
Format: Artikel
Sprache:eng
Schlagworte:
Analog integrated circuits
BiCMOS integrated circuits
Circuit testing
Comparators
Devices
Equivalence
Fabrication
Helium
Industry standards
Integrated circuit testing
Performance enhancement
Radiation effects
Radiation hardening
Redundancy
Voting
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Beschreibung
Zusammenfassung:Describes design considerations and single-event effect (SEE) testing results of a hardened quad comparator equivalent to the industry standard "139" device. The hardened part uses redundancy and hardened complementary BiCMOS processing to achieve improved SEE performance.
ISSN:0018-9499
1558-1578
DOI:10.1109/23.983143