A lateral force microscopy study of friction between glassy carbon and different surfaces

A Nanoscope III atomic force microscope (AFM) was used to measure the friction between glassy carbon microspheres, glued to the AFM cantilever, and flat surfaces of silicon, carbon, steel and silver. The measured friction data was fitted using the Derjaguin–Müller–Toporov (DMT) model. The work of ad...

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Veröffentlicht in:	Surface and interface analysis 2004-08, Vol.36 (8), p.1246-1249
Hauptverfasser:	Stiess, S., Richter, A., King, B. V., Reitsma, M., Smith, R.
Format:	Artikel
Sprache:	eng
Schlagworte:	adhesion AFM Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties contact mechanics Cross-disciplinary physics: materials science rheology DMT Exact sciences and technology friction glassy carbon Physics
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Zusammenfassung:	A Nanoscope III atomic force microscope (AFM) was used to measure the friction between glassy carbon microspheres, glued to the AFM cantilever, and flat surfaces of silicon, carbon, steel and silver. The measured friction data was fitted using the Derjaguin–Müller–Toporov (DMT) model. The work of adhesion between the spheres and the surfaces ranged from 0.45 mNm−1 for the carbon surface to 19 mNm−1 for the silicon surface. The work of adhesion was found to be proportional to the interfacial shear strength for silver, steel and carbon. Copyright © 2004 John Wiley & Sons, Ltd.
ISSN:	0142-2421 1096-9918
DOI:	10.1002/sia.1886