Hysteresis in the melting kinetics of Bi nanoparticles
Structural properties as a function of temperature of bismuth nanocrystals embedded in amorphous germanium thin films, synthesised by laser ablation are investigated by Raman spectroscopy and X-ray diffraction. In addition to temperature anharmonic effects, Raman spectroscopy results reveal a meltin...
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Veröffentlicht in: | Thin solid films 2004-04, Vol.453-454 (Complete), p.467-470 |
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Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | Structural properties as a function of temperature of bismuth nanocrystals embedded in amorphous germanium thin films, synthesised by laser ablation are investigated by Raman spectroscopy and X-ray diffraction. In addition to temperature anharmonic effects, Raman spectroscopy results reveal a melting solidification hysteresis, which takes place below the melting point of bulk bismuth. Furthermore, preliminary X-ray diffraction results suggest that the nanocrystals change in structure upon heating until melting occurs. However, the nanocrystals recover their original structure once the sample is cooled at room temperature. |
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ISSN: | 0040-6090 1879-2731 |
DOI: | 10.1016/j.tsf.2003.11.134 |