Hysteresis in the melting kinetics of Bi nanoparticles

Structural properties as a function of temperature of bismuth nanocrystals embedded in amorphous germanium thin films, synthesised by laser ablation are investigated by Raman spectroscopy and X-ray diffraction. In addition to temperature anharmonic effects, Raman spectroscopy results reveal a meltin...

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Veröffentlicht in:Thin solid films 2004-04, Vol.453-454 (Complete), p.467-470
Hauptverfasser: Haro-Poniatowski, E., Serna, R., Afonso, C.N., Jouanne, M., Morhange, J.F., Bosch, P., Lara, V.H.
Format: Artikel
Sprache:eng
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Zusammenfassung:Structural properties as a function of temperature of bismuth nanocrystals embedded in amorphous germanium thin films, synthesised by laser ablation are investigated by Raman spectroscopy and X-ray diffraction. In addition to temperature anharmonic effects, Raman spectroscopy results reveal a melting solidification hysteresis, which takes place below the melting point of bulk bismuth. Furthermore, preliminary X-ray diffraction results suggest that the nanocrystals change in structure upon heating until melting occurs. However, the nanocrystals recover their original structure once the sample is cooled at room temperature.
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2003.11.134