Comparison of IC conducted emission measurement methods

Comparison of IC conducted emission measurement methods

This paper deals with the electromagnetic emissions of integrated circuits. In particular, four measurement techniques to evaluate integrated circuit conducted emissions are described in detail and they are employed for the measurement of the power supply conducted emission delivered by a simple int...

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Veröffentlicht in:IEEE transactions on instrumentation and measurement 2003-06, Vol.52 (3), p.839-845
Hauptverfasser: Fiori, F., Musolino, F.
Format: Artikel
Sprache:eng
Schlagworte:
Drivers
Electromagnetic measurements
Emission
Emission analysis
Instrumentation
Integrated circuit measurements
Integrated circuits
Magnetic field measurement
Measurement methods
Measurement techniques
Packaging
Power measurement
Power supplies
Probes
Sections
Synchronous
TEM cells
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Beschreibung
Zusammenfassung:This paper deals with the electromagnetic emissions of integrated circuits. In particular, four measurement techniques to evaluate integrated circuit conducted emissions are described in detail and they are employed for the measurement of the power supply conducted emission delivered by a simple integrated circuit composed of six synchronous switching drivers. Experimental results obtained by employing such measurement methods are presented and the influence of each test setup on the measured quantities is discussed.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2003.814685