Charge yield for cobalt-60 and 10-keV X-ray irradiations of MOS devices

The radiation response of MOS devices exposed to /sup 60/Co and low-energy ( approximately 10 keV) X-ray irradiation is evaluated as a function of electric field during exposure. Improved charge yield estimates are obtained for /sup 60/Co irradiations at fields below 1 MV/cm by matching voltage shif...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) 1991-12, Vol.38 (6), p.1187-1194
Hauptverfasser:	Shaneyfelt, M.R., Fleetwood, D.M., Schwank, J.R., Hughes, K.L.
Format:	Artikel
Sprache:	eng
Schlagworte:	426000 - Engineering- Components, Electron Devices & Circuits- (1990-) 440200 - Radiation Effects on Instrument Components, Instruments, or Electronic Systems Annealing Applied sciences BETA DECAY RADIOISOTOPES BETA-MINUS DECAY RADIOISOTOPES CHARGE COLLECTION COBALT 60 COBALT ISOTOPES Compound structure devices Costs DOSE RATES ELECTROMAGNETIC RADIATION Electronics ENERGY RANGE ENGINEERING Exact sciences and technology HARDENING INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY INTERFACES INTERMEDIATE MASS NUCLEI INTERNAL CONVERSION RADIOISOTOPES Ionizing radiation IONIZING RADIATIONS Isolation technology ISOMERIC TRANSITION ISOTOPES ISOTOPES KEV RANGE KEV RANGE 01-10 Laboratories MINUTES LIVING RADIOISOTOPES MOS devices MOS TRANSISTORS NUCLEI ODD-ODD NUCLEI PHYSICAL RADIATION EFFECTS RADIATION EFFECTS RADIATION HARDENING RADIATIONS RADIOISOTOPES SEMICONDUCTOR DEVICES Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Spontaneous emission Testing TRANSISTORS Voltage X RADIATION YEARS LIVING RADIOISOT Yield estimation
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	The radiation response of MOS devices exposed to /sup 60/Co and low-energy ( approximately 10 keV) X-ray irradiation is evaluated as a function of electric field during exposure. Improved charge yield estimates are obtained for /sup 60/Co irradiations at fields below 1 MV/cm by matching voltage shifts due to oxide-trap and interface-trap charge to an E/sup -0.55/ electric field dependence. Combining these improved charge yield estimates and calculated dose enhancement factors, the relative response of X-ray to /sup 60/Co irradiations is accurately predicted for oxide electric fields from 0.03 MV/cm to 5.0 MV/cm. The ability to predict the relative response to X-ray to /sup 60/Co irradiations-should speed acceptance of X-ray testers as a hardness assurance tool.< >
ISSN:	0018-9499 1558-1578
DOI:	10.1109/23.124092