High-order spatial phase shift method realizes modulation analysis through a single-frame image

For the modulation-based structured illumination microscopy system, how to obtain modulation distribution with an image has been a research hotspot. However, the existing frequency-domain single-frame algorithms (mainly including the Fourier transform method, wavelet method, etc.) suffer from differ...

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Veröffentlicht in:Applied optics (2004) 2023-05, Vol.62 (13), p.3422-3430
Hauptverfasser: Long, Yuliang, Tang, Yan, Cheng, Xiaolong, Han, Chenhaolei, Xiang, Qianjin, Yang, Yong, Zhao, Lixin, Feng, Jinhua
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Sprache:eng
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Zusammenfassung:For the modulation-based structured illumination microscopy system, how to obtain modulation distribution with an image has been a research hotspot. However, the existing frequency-domain single-frame algorithms (mainly including the Fourier transform method, wavelet method, etc.) suffer from different degrees of analytical error due to the loss of high-frequency information. Recently, a modulation-based spatial area phase-shifting method was proposed; it can obtain higher precision by retaining high-frequency information effectively. But for discontinuous (such as step) topography, it would be somewhat smooth. To solve the problem, we propose a high-order spatial phase shift algorithm that realizes robust modulation analysis of a discontinuous surface with a single-frame image. At the same time, this technique proposes a residual optimization strategy, so that it can be applied to the measurement of complex topography, especially discontinuous topography. Simulation and experimental results demonstrate that the proposed method can provide higher-precision measurement.
ISSN:1559-128X
2155-3165
1539-4522
DOI:10.1364/AO.488041