The X-ray characterization of Bi2Sr2CaCu2O8+x single crystals grown by different methods

Authors report on results of systematic X-ray investigations of the Bi2Sr2CaCu2O8+x (2212) single crystals grown by slow cooling, top seeded solution growth and travelling solvent floating zone (TSFZ) methods. The typical concentrations of dislocations in the Bi-2212 crystals are estimated from widt...

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Veröffentlicht in:	Physica. C, Superconductivity Superconductivity, 2003-01, Vol.383 (4), p.431-437
Hauptverfasser:	Bdikin, I.K, Maljuk, A.N, Kulakov, A.B, Lin, C.T, Kumar, P, Kumar, B, Trigunayat, G.C, Emel’chenko, G.A
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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Zusammenfassung:	Authors report on results of systematic X-ray investigations of the Bi2Sr2CaCu2O8+x (2212) single crystals grown by slow cooling, top seeded solution growth and travelling solvent floating zone (TSFZ) methods. The typical concentrations of dislocations in the Bi-2212 crystals are estimated from width of peaks. According to the obtained X-ray topography and diffractometry data, these crystals demonstrate misorientation anisotropy around different crystallographic axes, which is a consequence of incommensurate modulation in this compound. The highly perfect crystals grown by TSFZ method are found to demonstrate the abnormal transmission XRD effect (Borrman effect). 18 refs.
ISSN:	0921-4534
DOI:	10.1016/S0921-4534(02)01792-6