Atomic-scale analysis of interfaces in an all-oxide magnetic tunnel junction

We use High Resolution Electron Microscopy (HRTEM) together with Electron Energy Loss Spectroscopy (EELS) to analyze the crystallography and the chemical configuration of interfaces in a state-of-the-art La2/3Sr1/3MnO3/SrTiO3/La2/3Sr1/3MnO3 tunnel junction. EELS indicates that manganese ions keep th...

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Veröffentlicht in:	European physical journal. Applied physics 2003-12, Vol.24 (3), p.215-221
Hauptverfasser:	Maurice, J.-L., Pailloux, F., Imhoff, D., Bonnet, N., Samet, L., Barthélémy, A., Contour, J.-P., Colliex, C., Fert, A.
Format:	Artikel
Sprache:	eng
Schlagworte:	68.37.Lp 75.47.Lx 75.70.Cn Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Electron, ion, and scanning probe microscopy Exact sciences and technology Interfacial magnetic properties (multilayers, magnetic quantum wells, superlattices, magnetic heterostructures) Magnetic properties and materials Magnetic properties of surface, thin films and multilayers Physics Structure of solids and liquids crystallography Transmission, reflection and scanning electron microscopy(including ebic)
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Zusammenfassung:	We use High Resolution Electron Microscopy (HRTEM) together with Electron Energy Loss Spectroscopy (EELS) to analyze the crystallography and the chemical configuration of interfaces in a state-of-the-art La2/3Sr1/3MnO3/SrTiO3/La2/3Sr1/3MnO3 tunnel junction. EELS indicates that manganese ions keep their bulk valency up to the last atomic plane in contact with the insulator. Tunnel magnetoresistance however decreases with temperature faster than magnetisation in these samples. Quantitative HRTEM reveals some local departures from chemical abruptness at the interfaces, which could play a role in this decrease.
ISSN:	1286-0042 1286-0050
DOI:	10.1051/epjap:2003071