The investigation of transport properties on Y1Ba2Cu3O7−x step edge junctions by ion beam etching

We have investigated the transport of Y1Ba2Cu3O7-x (YBCO) step edge junctions with a wide range of normal resistance Rn, which were obtained by ion beam etching (trimming) the YBCO thin film on the junction area. A SS'IS'S junction model (S: superconductor, S': superconductor with a r...

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Veröffentlicht in:Physica. C, Superconductivity Superconductivity, 2003-04, Vol.385 (4), p.466-472
Hauptverfasser: Lam, S.K.H., Gnanarajan, S.
Format: Artikel
Sprache:eng
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Zusammenfassung:We have investigated the transport of Y1Ba2Cu3O7-x (YBCO) step edge junctions with a wide range of normal resistance Rn, which were obtained by ion beam etching (trimming) the YBCO thin film on the junction area. A SS'IS'S junction model (S: superconductor, S': superconductor with a reduced order parameter and I: insulator) has been used to explain the change of the junction parameters after trimming. It is noticed that there is a reduction of both superconducting order parameter and the effective area on S' after trimming.
ISSN:0921-4534
DOI:10.1016/s0921-4534(02)02275-x