Ion-Beam-Assisted Lift-Off Technique for Three-Dimensional Micromachining of Freestanding Single-Crystal Diamond

The machining of 3D microstructures in single‐crystal artificial diamond is demonstrated with a focused ion beam (FIB)‐assisted lift‐off technique. A sacrificial buried layer is created with MeV ion implantation, followed by patterning of selected regions with the FIB technique; the sacrificial laye...

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Veröffentlicht in:Advanced materials (Weinheim) 2005-10, Vol.17 (20), p.2427-2430
Hauptverfasser: Olivero, P., Rubanov, S., Reichart, P., Gibson, B. C., Huntington, S. T., Rabeau, J., Greentree, A. D., Salzman, J., Moore, D., Jamieson, D. N., Prawer, S.
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Sprache:eng
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Zusammenfassung:The machining of 3D microstructures in single‐crystal artificial diamond is demonstrated with a focused ion beam (FIB)‐assisted lift‐off technique. A sacrificial buried layer is created with MeV ion implantation, followed by patterning of selected regions with the FIB technique; the sacrificial layer is then selectively etched, leaving 3D free‐standing microstructures in the bulk (see Figure). Using this fabrication technique, light waveguiding through a microstructure in single‐crystal diamond is demonstrated for the first time.
ISSN:0935-9648
1521-4095
DOI:10.1002/adma.200500752